SiC Device Tester

Product Introduction  

The product features a desktop structure designed for placement on a workbench, consisting of two main components: the test host and the programmable computer. It supports external fixtures and adapters, and can optionally connect to sorting machines and robotic arms via Prober or Handler interfaces (16Bin) to establish a workstation for rapid batch testing. Through software configuration, it automatically categorizes and stores components based on their parameter grades. It is well-suited for various scenarios such as "Incoming Quality Control," "Failure Analysis," "Component Matching," and "Mass Production Testing."

The product demonstrates excellent performance in reliability, repeatability of test data, and testing efficiency. The innovative "point-control fixture" allows operators to perform tests with a single touch on the fixture, making operations simpler and more efficient. Test data can be saved in Excel format.

Application Scenarios

Ø Testing and Analysis (Initial testing during the R&D and design phase of power devices)

Ø Failure Analysis (Testing and analyzing failed components to identify failure mechanisms, enabling improvements in the overall design and usage process of electronic systems)

Ø Component Matching (Conducting comprehensive testing before components are soldered onto circuit boards, and categorizing and pairing components with consistent test data)

Ø Incoming Quality Control (Sampling or full inspection of incoming components by quality departments (IQC) in research institutes and electronics factories to ensure component yield rates)

Ø Mass Production Testing (Can connect to various auxiliary equipment such as robotic arms, barcode scanners, and sorting machines to achieve large-scale, automated testing)